X-ray diffractometer Bruker D8 micro-source
- X-ray diffraction applications: reflectometry, high-resolution diffraction, grazing incidence diffraction, small angle x-ray scattering, residual stress and texture investigations
- Montel optics (Göbel mirrors arranged side by side with a 90° angle to each other) with output beam size 2 mm x 2 mm. Flux density > 107 CPS/mm2
- 2 Bounce monochromator Ge022 aligned for Cu radiation. Typical beam divergence = 0.0085°
- Collimators: 2 mm, 1 mm, 0.5 mm, 0.3 mm
- Axial Soller slit, masks, slits and Ni filters for the incident beam
- Vertical Eulerian cradle: 2θ (-4° to 170°), Chi circle (-11° to 98°), Phi circle (unlimited), x- and y- translation (-40 mm to 40 mm), Z translation (2 mm). Maximum sample weight: 1kg, maximum sample height: 40 mm
- Double laser unit for alignment
- Pathfinder for diffracted optics with 3-bounce Ge022 monochromator, variable slit and Soller slit
- Dynamic scintillation counter
- 1D detector with 0°/90° mount