Atomic Force Microscope (AFM) Jupiter XR
- High spatial resolution (noise floor <25 pm)
- Fast imaging
- Various Operating Modes (Tapping mode, Contact mode, Force curves, Magnetic force microscopy, Nanolithography, etc.)
- blueDrive Tapping Mode (photothermal excitation)
- 2 software interfaces: Ergo and Igor
- Variable Field Module for application of magnetic fields (up to +/- 0.8 T in-plane and
+/- 0.12 T out-of-plane) - Floating stage controller to minimize vibrations